An NRC Institute for Information Technology (NRC-IIT) paper "Basic theory on surface measurement uncertainty of 3D imaging systems", published in the Proceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE) gained enhanced visibility and prestige when it was recognized as one of the most frequently downloaded papers in April 2010 from the SPIE Digital Library amongst the nine others in the category Electronic Imaging & Signal Processing.
The paper, edited and presented by NRC-IIT principal researcher Jean-Angelo Beraldin at the SPIE 2009 3D imaging metrology conference, reviews the basic principles of 3D imaging systems and focuses on the need for standards along with testing methods for evaluating and characterizing 3D imaging sensors and algorithms.
Mr. Beraldin is the researcher in charge of the 3D Imaging and Modeling Metrology project at NRC-IIT. He is also the conference chair of the SPIE 3D Imaging Metrology Conference, which will be held from January 23-27, 2011 in San Francisco (California). The conference will provide a forum for researchers, developers, users, and policy makers to present the latest advances in 3D imaging and modeling of existing objects and sites along with the most recent work in 3D imaging standard creation.
NRC-IIT was also popular with two new entries for May 2010. In fact, two other NRC-IIT researchers had papers listed in the top-ten downloads in the category Industrial Sensing & Measurement. The author, David MacKinnon, is a research associate on the 3D Imaging and Modeling project, and his co-author, François Blais, is a principal researcher at NRC-IIT and is the group leader of NRC-IIT’s Visual Information Technology (VIT) group in Ottawa. The two papers that appeared in Journal of Electronic Imaging were “Measurement Quality Metrics for Rapid Laser Range Scanning” and “Review of Measurement Quality Metrics for Range Imaging.”
SPIE is the international society for optics and photonics founded in 1955 to advance light-based technologies. Serving more than 188,000 constituents from 138 countries, the Society advances emerging technologies through interdisciplinary information exchange, continuing education, publications, patent precedent, and career and professional growth. The SPIE Digital Library is the most extensive resource available on optics and photonics, providing unprecedented access to more than 275,000 technical papers from SPIE Journals and Conference Proceedings from 1990 to the present. More than 17,000 new research papers are added annually.
